Molecular Analysis Facility staff member Dan Graham was recently selected to receive the 2021 AVS Applied Surface Science Division Peter M. A. Sherwood Mid-Career Professional Award for innovation and leadership in the application of Time-of-flight secondary ion mass spectrometry (ToF-SIMS) to organic and biological materials and for the development of practical multivariate analysis tools, which are widely used in the applied surface science community. He will give a presentation at the upcoming AVS meeting.
As a senior research scientist in the MAF, he works with users who are interested in acquiring data from the MAF’s surface analytical equipment, especially their ToF-SIMS system. In addition to helping users with experimental design, data collection and data analysis, he also maintains the ToF-SIMS system and makes sure it is running optimally.
Learn more about Dr. Graham in our Q&A below.
I received a B.S in Chemical Engineering from Brigham Young University and a Ph.D. in Bioengineering from the University of Washington. My Ph.D. thesis work focused on the creation and analysis of self-assembled monolayers (SAMs) using ToF-SIMS and multivariate analysis. After graduating I worked as a research scientist with NESAC/BIO and SARC (now the MAF). In 2006 I left the UW to help found Asemblon Inc. where I worked for 4 years as a principal scientist in charge of surface engineering research. In 2010, I returned to the UW where I am a Senior Research Scientist in the MAF. I have 24 years of experience in surface preparation and characterization and I have analyzed a wide range of materials ranging from polymers, metals, electronics, and composites to cells, tissues and biomaterials.
